Subject
X-ray analysis
3
X-ray spectroscopy
3
diffraction
3
mechanical stress
3
strain
film
2
instrumentation
2
polymer
2
X-ray scattering
1
X-ray source
1
X-ray spectrometer
1
application
1
counting device
1
detector
1
determination
1
epitaxy
1
geology
1
high temperature
1
industrial use
1
monochromator
1
monocrystal
1
online measuring method
1
powder diffraction
1
reflection
1
semiconductor
1
structure
1
thin film
1