Classification
FHEG - Tunneling microscopy, force microscopy
7
FFA - Surface science, surface physics - general aspects
3
FFPE - Thin film electronic properties, semiconductor interfaces
3
FHA - Materials characterization - general aspects
3
FHE - Imaging methods in materials characterization
3
FFJ - Surface structure, gas solid interface
2
FJC - Electronic properties of solids
2
FJEH - Molecular electronics
2
FKC - Magnetism - specific aspects
2
CHJ - Molecular physics, molecular structure
1
CLJE - Catalyst characterization and surface phenomena
1
CLP - Colloid chemistry, surface chemistry
1
CNU - Electrochemical synthesis, electrochemical engineering
1
FFJE - Molecular surface processes, gas surface interaction, adsorption
1
FFP - Physics of thin films
1
FGK - Thin film technology, epitaxy
1
FGP - Nanoelectronics
1
FHAB - Surface and thin film characterization
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
FJE - Electronic properties of disordered systems
1
FJH - Semiconductor physics
1
FJK - Specific semiconductor materials
1
FJL - Physics of solid state devices
1
FNX - Carbon, carbon materials
1