Classification
FCAB - X-ray crystallography, X-ray diffraction
112
FAAA - Crystallography - reference books
47
FCBH - Crystal structure of specific substances
45
FCAD - Crystal structure analysis
27
FHN - Neutron scattering
27
FHC - Diffraction methods in materials characterization
26
FHG - Electron microscopy
23
FHGE - Electron diffraction
23
CUK - X-ray spectroscopy
22
FCA - Crystallography
22
FHA - Materials characterization - general aspects
18
CUA - Spectroscopy
16
FHCB - X-ray scattering
15
LMN - Molecular biophysics, biophysical chemistry
13
FFGC - Electron spectroscopy
12
FFJ - Surface structure, gas solid interface
12
PEG - Optics
10
CUO - Molecular spectroscopy
9
CUUB - NMR (Nuclear Magnetic Resonance) spectroscopy
9
FFA - Surface science, surface physics - general aspects
8
FHJ - Scanning electron microscopy, analytical electron microscopy
8
FHTD - Mössbauer spectroscopy
8
FCDE - Symmetry in condensed matter
6
FHAB - Surface and thin film characterization
6
FHCF - Defect characterization
6
FHL - Synchrotron radiation techniques
6
FNCG - Specific molecular crystals
6
CUKF - X-ray fluorescence analysis
5
FAF - Materials research - comprehensive works
5
FHE - Imaging methods in materials characterization
5
LKN - Biochemistry of proteins, peptides, amino acids
5
FCD - Crystal physics
4
FFG - Surface electronic effects
4
FGK - Thin film technology, epitaxy
4
FHGB - Conventional electron microscopy
4
FHLB - Soft X-ray spectroscopy
4
FHND - Neutron scattering instrumentation
4
FMGH - Metallographic microscopy, metallographic stereology
4
FNC - Molecular crystals, organic crystals
4
LAA - Biology - reference books
4
MSD - Mathematical methods in physics
4
FAP - Advanced materials - development and applications
3
FEJB - Amorphous materials
3
FFJE - Molecular surface processes, gas surface interaction, adsorption
3
FFP - Physics of thin films
3
FFPE - Thin film electronic properties, semiconductor interfaces
3
FFPG - Multilayer systems, quantum structures
3
FGKC - Vacuum deposition, MBE
3
FGN - Nanotechnology
3
FHEE - X-ray microscopy, surface topography
3
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