Classification
FHEG - Tunneling microscopy, force microscopy
FHAB - Surface and thin film characterization
4
FHA - Materials characterization - general aspects
3
FHE - Imaging methods in materials characterization
3
FNX - Carbon, carbon materials
3
FFJ - Surface structure, gas solid interface
2
CLJE - Catalyst characterization and surface phenomena
1
CLP - Colloid chemistry, surface chemistry
1
CNRO - Electrode processes
1
CUSE - Raman spectroscopy
1
FFA - Surface science, surface physics - general aspects
1
FFJE - Molecular surface processes, gas surface interaction, adsorption
1
FFM - Liquid interfaces, adhesion
1
FGCB - Nucleation, crystallization phenomena
1
FGK - Thin film technology, epitaxy
1
FJH - Semiconductor physics
1
FJKB - Elemental semiconductors
1
FJKC - III - V semiconductors
1
FLE - Superconductor materials
1
LTH - Biotechnology - methods
1