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Clement, J. Joseph
IFF
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Clement, J. Joseph
IFF
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Materials reliability in microelectronics. 7 : symposium held March 31-April 3, 1997, San Francisco, California, USA /
Clement, J. Joseph
1997
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“
...
mechanical
properties...
”
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IFF
Name
Clement, J. Joseph
Subject
mechanical properties
1
microelectronics
1
microstructure
1
reliability
1
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FGMH - Metallization, physics of microelectronics
1
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