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Gilfrich, John V.
diffraction
AND
strain
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Gilfrich, John V.
diffraction
AND
strain
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Book
Annual conference on applications of X-ray analysis. 41. Proceedings : Colorado-Springs, CO, 03.08.96-07.08.96 /
Gilfrich, John V.
1995
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2
Book
Annual conference on applications of X-ray analysis. 42. Proceedings : Denver, CO, 02.08.93-06.08.93 /
Gilfrich, John V.
1995
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X
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ray
spectroscopy
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Name
Gilfrich, John V.
Subject
X-ray analysis
2
X-ray spectroscopy
2
diffraction
mechanical stress
2
strain
X-ray spectrometer
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counting device
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detector
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determination
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epitaxy
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film
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geology
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high temperature
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industrial use
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instrumentation
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monochromator
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monocrystal
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online measuring method
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polymer
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CUK - X-ray spectroscopy
2
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English
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