Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Joy, David C.
X-ray microanalysis
Reset Filters
Show filters (2)
Joy, David C.
X-ray microanalysis
Ask a Librarian
Books & more
: Hits
1 - 1
of
1
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
Scanning electron microscopy and x-ray microanalysis /
Goldstein, Joseph
2003
Other Personal Name(s):
“
...
Echlin
,
Patrick
...
”
Call number:
Loading...
Located:
Loading...
Table of Contents
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Print Edition
1
Material Type
Book
1
Year of Publication
From:
To:
Location
IAS-9
1
Name
Echlin, Patrick
1
Goldstein, Joseph
1
Joy, David C.
Lyman, Charles E.
1
Newbury, Dale E.
1
Subject
X-ray microanalysis
scanning electron microscopy
1
Classification
FHJ - Scanning electron microscopy, analytical electron microscopy
1
Language
English
1
×
Loading...
