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Lüpke, Felix
FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
scanning tunneling microscopy
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Lüpke, Felix
FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
scanning tunneling microscopy
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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /
Lüpke, Felix
2018
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Electronic Edition
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1
Name
Lüpke, Felix
Subject
defect analysis
1
insulator
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scanning tunneling microscopy
thin film
1
Classification
FHEG - Tunneling microscopy, force microscopy
Language
English
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