1
Sio2 and its interfaces: symposium : Fall meeting of the Materials Research Society. 1987 : Boston, MA, 30.11.87-05.12.87.
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“...FFPE - Thin film electronic properties, semiconductor interfaces...”
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The Physics of MOS insulators : proceedings of the International Topical Conference on the Physics of MOS Insulators, held at the Jane S. McKimmon Conference Center, North Carolina State University Raleigh, North Carolina, June 18-20, 1980 /
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“...FFPE - Thin film electronic properties, semiconductor interfaces...”
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The physics of SIO2 and its interfaces : The physics of sio2 and its interfaces: international topical conference : Yorktown-Heights, NY, 22.03.78-24.03.78.
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“...FFPE - Thin film electronic properties, semiconductor interfaces...”
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