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Sarikaya, M.
imaging technique
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Sarikaya, M.
imaging technique
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Determining nanoscale physical properties of materials by microscopy and spectroscopy: symposium : Boston, MA, 29.11.93-03.12.93.
Sarikaya, M.
1994
Subject (ZB):
“
...electron
diffraction
...
”
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Sarikaya, M.
Subject
III - V semiconductor
1
atomic spectroscopy
1
atomic structure
1
cermet
1
dynamic properties
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electron diffraction
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epitaxy
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high resolution
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holography
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imaging technique
magnetic resonance
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materials
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microscopy
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physical properties
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scanning tunneling microscopy
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solid state phase transition
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spectroscopy
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surface structure
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transmission electron microscopy
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FAP - Advanced materials - development and applications
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