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CUA - Spectroscopy
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Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium im Hinblick auf optische und optoelektronische Anwendungen [E-Book] /
Thönissen, Markus
1999
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optoelectronics
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Millimeter components and techniques. 5 /
Adlerstein, M. G.
1985
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optoelectronics
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Name
Adlerstein, M. G.
1
Button, Kenneth John
1
Thönissen, Markus
1
Subject
optoelectronics
2
antenna
1
diode
1
integrated circuit
1
porous silicon
1
spectroscopy
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transducer
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CUA - Spectroscopy
FEJP - Porous media, capillarity
1
FHAB - Surface and thin film characterization
1
FJKB - Elemental semiconductors
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English
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German
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