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FCD - Crystal physics
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FHAB - Surface and thin film characterization
Theses
thin film
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FCD - Crystal physics
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FHAB - Surface and thin film characterization
Theses
thin film
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1
Book
Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Fink, Thomas
2018
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie [E-Book] /
Fink, Thomas
2018
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Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem...
Michard, Stephan Yann
2015
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Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem...
Michard, Stephan Yann
2015
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Available as
Electronic Edition
2
Print Edition
2
Material Type
Book
4
Type of Literature
Theses
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ZB
4
Name
Fink, Thomas
2
Michard, Stephan Yann
2
Subject
silicon
4
thin film
chemical vapor deposition
2
crystal growth
2
crystal structure analysis
2
deposition
2
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materials characterization
2
microtechnology
2
raman spectroscopy
2
silicon solar cell
2
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Classification
FCBH - Crystal structure of specific substances
4
FCD - Crystal physics
FHAB - Surface and thin film characterization
CUSE - Raman spectroscopy
2
EISF - Thin film solar cells
2
FCA - Crystallography
2
Language
English
2
German
2
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