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FDCB - Point defects
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FHCF - Defect characterization
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FDCB - Point defects
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FHCF - Defect characterization
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1
E-Book
Point defects in compound semiconductor surfaces [E-Book] /
Ebert, Philipp
2001
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E-Book
Änderung der Laue-Bragg-Reflexe und des Volumens eines Kristalls durch statistisch verteilte Punktfehlstellen [E-Book] /
Fischer, K.
1963
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defects
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Available as
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2
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Book
2
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1
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1
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ZB
2
Name
Ebert, Philipp
1
Fischer, K.
1
Hahn, Hanno
1
Subject
compound semiconductor
1
point defect
1
scanning tunneling microscopy
1
Classification
FDCB - Point defects
FHCF - Defect characterization
FCAB - X-ray crystallography, X-ray diffraction
1
FJHE - Defects and radiation effects in semiconductors
1
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English
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German
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