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FFPE - Thin film electronic properties, semiconductor interfaces
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FHGJ - High resolution and high voltage electron microscopy
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FFPE - Thin film electronic properties, semiconductor interfaces
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FHGJ - High resolution and high voltage electron microscopy
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Kompositionelle und strukturelle Charakterisierung von verspannten Si/SiGe-Heterostrukturen mit hochauflösender Transmissionselektronenmikroskopie [E-Book] /
Stenkamp, Dirk
1993
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ZB
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Name
Stenkamp, Dirk
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Subject
semiconductor heterostructure
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strained layer
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transmission electron microscopy
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FFPE - Thin film electronic properties, semiconductor interfaces
FHGJ - High resolution and high voltage electron microscopy
FJKB - Elemental semiconductors
1
Language
German
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