1
Study on the electroforming and resistive switching behaviour of nickel oxide thin films for non-volatile memory applications /
Book
2
Study on the electroforming and resistive switching behaviour of nickel oxide thin films for non-volatile memory applications [E-Book] /
3
Carrier mobility in advanced channel materials using alternative gate dielectrics /
Book
4
Integration and characterization of atomic layer deposited TiO2 thin films for resistive switching applications /
Book
5
Integration and characterization of atomic layer deposited TiO2 thin films for resistive switching applications [E-Book] /
6
Ion beam treatment of functional layers in thin-film silicon solar cells /
Book
7
Ion beam treatment of functional layers in thin-film silicon solar cells [E-Book] /
8
Interface phenomena in La1/3Sr2/3FeO3/La2/3Sr1/3MnO3 heterostructures and a quest for p-electron magnetism /
Book
9
Interface phenomena in La1/3Sr2/3FeO3/La2/3Sr1/3MnO3 heterostructures and a quest for p-electron magnetism [E-Book] /
10
Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /
Book
11
Direct measurement of anisotropic resistivity in thin films using a 4-probe STM [E-Book] /
12
Growth and characterization of crystalline rare-earth based thin oxide films for the application as gate dielectric in nanotechnology /
Book
13
Growth and characterization of crystalline rare-earth based thin oxide films for the application as gate dielectric in nanotechnology [E-Book] /
14
Defect engineering of SrTiO3 thin films for resistive switching applications /
Book
15
Defect engineering of SrTiO3 thin films for resistive switching applications [E-Book] /
16
Carrier mobility in advanced channel materials using alternative gate dielectrics [E-Book] /
17
Magnetic, structural, and electronic properties of NiFe2O4 ultrathin films /
Book
18
Magnetic, structural, and electronic properties of NiFe2O4 ultrathin films [E-Book] /
19
Chemical control of the electrical surface properties of n-doped transition metal oxides /
Book
20
Controlling the electrical properties of oxide heterointerfaces through their interface chemistry /
Book