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FFPE - Thin film electronic properties, semiconductor interfaces
heterojunction
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FFPE - Thin film electronic properties, semiconductor interfaces
heterojunction
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography /
Wang, Yuhan
2021
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Wang, Yuhan
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III - V semiconductor
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heterojunction
holography
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nitride
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scanning tunneling microscopy
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semiconductor heterostructure
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FFPE - Thin film electronic properties, semiconductor interfaces
FJL - Physics of solid state devices
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