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FFPE - Thin film electronic properties, semiconductor interfaces
heterojunction
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FFPE - Thin film electronic properties, semiconductor interfaces
heterojunction
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography /
Wang, Yuhan
2021
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography [E-Book] /
Wang, Yuhan
2021
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3
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Low dimensional semiconductors : materials, physics technology, devices.
Kelly, M. J.
1995
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2
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1
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ZB
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IBN-1-2
1
Name
Wang, Yuhan
2
Kelly, M. J.
1
Subject
III - V semiconductor
3
heterojunction
holography
2
nitride
2
scanning tunneling microscopy
2
semiconductor heterostructure
2
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transmission electron microscopy
2
crystal growth
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electron gas
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low dimensional system
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semiconductor device
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semiconductor physics
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semiconductor surface
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transistor
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FFPE - Thin film electronic properties, semiconductor interfaces
FJL - Physics of solid state devices
2
FFPG - Multilayer systems, quantum structures
1
TBF - Semiconductor devices
1
Language
English
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