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FFPE - Thin film electronic properties, semiconductor interfaces
scanning tunneling microscopy
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FFPE - Thin film electronic properties, semiconductor interfaces
scanning tunneling microscopy
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1
Book
Surface states and Fermi-level pinning on non-polar binary and ternary (Al,Ga)N surfaces /
Freter, Lars
2022
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography /
Wang, Yuhan
2021
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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /
Flatten, Tim
2020
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Available as
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3
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Book
3
Type of Literature
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Location
ZB
3
Name
Flatten, Tim
1
Freter, Lars
1
Wang, Yuhan
1
Subject
scanning tunneling microscopy
III - V semiconductor
1
electron transport
1
electronic properties
1
heterojunction
1
holography
1
more ...
multilayer system
1
nitride
1
optoelectronics
1
semiconductor
1
semiconductor heterostructure
1
thin film
1
transmission electron microscopy
1
tunnel effect
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Classification
FFPE - Thin film electronic properties, semiconductor interfaces
FJC - Electronic properties of solids
1
FJL - Physics of solid state devices
1
Language
English
3
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