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FGGJ - Ion beam analysis, ion beam solid interaction
ZB
Conference Publication
secondary ion emission
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FGGJ - Ion beam analysis, ion beam solid interaction
ZB
Conference Publication
secondary ion emission
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Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
Benninghoven, A.
1984
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Secondary ion mass spectrometry: international conference 0003: proceedings : SIMS 0003: proceedings : Budapest, 30.08.81-05.09.81.
Benninghoven, A.
1982
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IEK-14
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ZB
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Benninghoven, A.
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secondary ion emission
SIMS (secondary ion mass spectroscopy)
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FGGJ - Ion beam analysis, ion beam solid interaction
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