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FGGJ - Ion beam analysis, ion beam solid interaction

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FGGJ - Ion beam analysis, ion beam solid interaction

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Pixe: a novel technique for elemental analysis.

Johansson, S. A.
1988

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Ein neues Desorptionsmodell und Flugzeitmessungen an Molekülen aus Oberflächenreaktionen.

Roehrer, L.

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Secondary ion mass spectroscopy of solid surfaces.

Cherepin, V. T.
1987

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Mikroanalyse mit Elektronen- und Ionensonden.

Brümmer, Otto
1980

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Ion solid interactions: fundamentals and applications.

Nastasi, M.
1996

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Medium energy ion reflection from solids.

Mashkova, E. S.
1985

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Microprobe analysis /

Andersen, Christian A.
1973

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Atomic collisions in solids. 4. physics of channeling and related phenomena: International conference on atomic collisions in solids . 4: physics of channeling and related phenomen...

Andersen, Sven Lilledal
1972

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Hydrogen: stopping powers and ranges in all elements /

Andersen, Hans Henrik
1977

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Bibliography and index of experimental range and stopping power data /

Andersen, Hans Henrik
1977

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Atomic and ionic impact phenomena on metal surfaces /

Kaminsky, Manfred
1965

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Rutherford Rückstreu Analysen mit Protonen.

Mommsen, H.
1980

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The stopping and range of ions in solids.

Ziegler, J. F.
1985

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Tables of range and stopping power of chemical elements for charged particles of energy 0.05 to 500 mev.

Williamson, C. F.
1966

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Handbook of modern ion beam materials analysis : appendices /

Wang, Yongqiang
2009

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Inelastic ion surface collisions: workshop : Inelastic ion surface collisions: international workshop 0002 : Hamilton, 14.08.78-16.08.78.

Kelly, R.
1979

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Inelastic ion surface collisions : proceedings of the international workshop. 0004 : Middelfart, 21.09.1982-24.09.1982.

Sigmund, P.
1983

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Range and stopping power tables for 2.5 - 100 MeV/nucleon heavy ions in solids.

Hubert, F.
1980

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Electron and ion beam methods for surface analysis : international workshop : Newcastle, 23.02.81-27.02.81.

Grant, J. T.
1982

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Ion implantation, laser treatment and ion beam analysis of materials : proceedings of the international workshop : Bombay, 09.02.81-13.02.81.

Sood, D. K.
1982

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Print Edition

Book 124

Conference Publication 57 Collection of Tables 13 Handbook, Textbook 6 Theses 3 Report 1

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To:

ZB 119 IEK-4 11 IEK-14 10 IKP 10 IBN-1-2 7 IBN-3-4 6 more ... IFF 4 IEK-2 2 see all ... less ...

Benninghoven, A. 8 Mayer, James W. 5 Ziegler, J. F. 4 Datz, S. 3 Gibson, W. M. 3 Kumakhov, M. A. 3 more ... Andersen, Hans Henrik 2 Archard, Geoffry D. 2 Arifov, Ubal Arifovich 2 Briggs, D. 2 Brümmer, Otto 2 Bulgakov, Yu. V. 2 Komarov, F. F. 2 Littmark, U. 2 Nastasi, M. 2 Romig, A. D. 2 Sebe, T. 2 Sigmund, P. 2 Tesmer, Joseph R. 2 Tolk, N. H. 2 Vickerman, John C. 2 Wang, Yongqiang 2 Ziegler, James F. 2 Andersen, Christian A. 1 Andersen, Sven Lilledal 1 Armstrong, John T. 1 Barbour, J. Charles 1 Behrens, H. 1 Behrisch, R. 1 Benninghoven, Alfred 1 see all ... less ...

ion beam solid interaction 15 channeling 14 ion beam analysis 11 SIMS (secondary ion mass spectroscopy) 10 atomic collision 7 desorption 7 more ... electron microprobe analysis 7 ion scattering 6 sputtering 6 backscattering 5 ion channeling 5 ion surface collision 5 radiation damage 5 stopping power 4 surface analysis 4 Auger electron spectroscopy 3 accelerator 3 activation analysis 3 charged particle 3 energy loss 3 instrumentation 3 ion implantation 3 ion irradiation 3 ion microprobe analysis 3 ion source 3 radiology 3 thin film 3 computer simulation 2 cross section 2 electron spectroscopy 2 see all ... less ...

FGGJ - Ion beam analysis, ion beam solid interaction FAAB - Solid state physics - reference books 15 FHJC - Microbeam analysis 14 FGGB - Ion implantation, ion beam synthesis 12 FGG - Ion beam technology 9 FHAB - Surface and thin film characterization 8 more ... FFGC - Electron spectroscopy 3 FFGH - Electron emission, field emission 3 FANE - Computational solid state physics 2 FDF - Radiation effects in solids 2 FGGE - Ion beam surface modification 2 FGJ - Laser and electron beam processing 2 CBRH - Inorganic clusters 1 CTYR - Microanalysis 1 CUW - Mass spectroscopy 1 FAF - Materials research - comprehensive works 1 FHA - Materials characterization - general aspects 1 FHEE - X-ray microscopy, surface topography 1 FHGE - Electron diffraction 1 FJCK - Electrical conduction in solid materials 1 FLE - Superconductor materials 1 PGLJ - Plasma wall interaction, divertors 1 see all ... less ...

English 21 German 1

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