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FGM - Microelectronic technology

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Books & more: Hits 1 - 20 of 95

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1

La gravure seche et le depot plasma en microelectronique: symposium international. 0003 : Cachan, 26.11.1985-29.11.1985.

Book

La gravure seche et le depot plasma en microelectronique: symposium international. 0003 : Cachan, 26.11.1985-29.11.1985.

1985

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2

International Symposium on Trends and New Applications in Thin Films: proceedings. vol 0001 : Strasbourg, 17.03.87-20.03.87.

Book

International Symposium on Trends and New Applications in Thin Films: proceedings. vol 0001 : Strasbourg, 17.03.87-20.03.87.

1987

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3

International symposium on trends and new applications in thin films: proceedings. vol 0002 : Strasbourg, 17.03.87-20.03.87.

Book

International symposium on trends and new applications in thin films: proceedings. vol 0002 : Strasbourg, 17.03.87-20.03.87.

1987

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4

Nanometer structure electronics : an investigation of the future of microelectronics : proceedings of the International Symposium on Nanometer Structure Electronics, April 16-18, 1984, Osaka University, Toyonaka, Japan /

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Nanometer structure electronics : an investigation of the future of microelectronics : proceedings of the International Symposium on Nanometer Structure Electronics, April 16-18, 1...

Yamamura, Yuichi.
1985

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5

Processing of electronic materials : proceedings of the First International Conference held at Santa Barbara, California, USA, February 23-28, 1987 /

Book

Processing of electronic materials : proceedings of the First International Conference held at Santa Barbara, California, USA, February 23-28, 1987 /

Law, Clarence G.
1987

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6

Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 /

Book

Wafer scale integration : proceedings of the IFIP WG 10.5 Workshop on Wafer Scale Integration, Grenoble, France, 17-19 March 1986 /

Saucier, Gabriele.
1986

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7

IEEE International Electronic Manufacturing Technology Symposium : September 15-17, 1986, Hilton Hotel & Tower, San Francisco, CA.

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IEEE International Electronic Manufacturing Technology Symposium : September 15-17, 1986, Hilton Hotel & Tower, San Francisco, CA.

1986

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8

Diagnostic techniques in VLSI fabrication : SEMICON/West, May 19-21, 1987, San Mateo, California /

Book

Diagnostic techniques in VLSI fabrication : SEMICON/West, May 19-21, 1987, San Mateo, California /

1987

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9

Electronic materials and processes : International sampe electronics conference. 0003 : Los-Angeles, CA, 20.06.89-22.06.89.

Book

Electronic materials and processes : International sampe electronics conference. 0003 : Los-Angeles, CA, 20.06.89-22.06.89.

Lockerby, S. C.
1989

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10

International symposium on advanced materials for ULSI. 0001: proceedings : Meeting of the Electrochemical Society. 0173 : Atlanta, GA, 15.05.88-20.05.88.

Book

International symposium on advanced materials for ULSI. 0001: proceedings : Meeting of the Electrochemical Society. 0173 : Atlanta, GA, 15.05.88-20.05.88.

Scott, M.
1988

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11

Vacuum microelectronics. 1989 : International conference on vacuum microelectronics. 0002: proceedings : Bath, 24.07.89-26.07.89.

Book

Vacuum microelectronics. 1989 : International conference on vacuum microelectronics. 0002: proceedings : Bath, 24.07.89-26.07.89.

Turner, R. E.
1989

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12

Symposium on VLSI technology. 0008, 1988: digest of technical papers : San-Diego, CA, 10.05.88-13.05.88.

Book

Symposium on VLSI technology. 0008, 1988: digest of technical papers : San-Diego, CA, 10.05.88-13.05.88.

Beguwala, M. M.
1988

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13

Microelectronic materials and processes : NATO advanced study institute on microelectronic materials and processes: proceedings : Castelvecchio-Pascoli, 30.06.86-11.07.86.

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Microelectronic materials and processes : NATO advanced study institute on microelectronic materials and processes: proceedings : Castelvecchio-Pascoli, 30.06.86-11.07.86.

Levy, R. A.
1989

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14

Symposium on VLSI Technology. 0007, 1987: digest of technical papers : Karuizawa, 18.05.87-21.05.87.

Book

Symposium on VLSI Technology. 0007, 1987: digest of technical papers : Karuizawa, 18.05.87-21.05.87.

Sugano, T.
1987

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15

Dünnschichttechnologien 1990 : Statusseminar Vol 2 : 27.06.90-29.06.90 : Berichte zu F und E Projekten aus dem Förderbereich Physikalische Technologien des Bundesministers für Forschung und Technologie.

Book

Dünnschichttechnologien 1990 : Statusseminar Vol 2 : 27.06.90-29.06.90 : Berichte zu F und E Projekten aus dem Förderbereich Physikalische Technologien des Bundesministers für Fors...

Doehl-Oelze, R.
1990

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16

Electronic materials and processes : International SAMPE Electronic Conference. 0001 : Santa-Clara, CA, 23.06.87-25.06.87.

Book

Electronic materials and processes : International SAMPE Electronic Conference. 0001 : Santa-Clara, CA, 23.06.87-25.06.87.

Kordsmeier, N. H.
1987

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17

European Hybrid Microelectronics Conference. 0003: proceedings : Avignon, 20.05.81-22.05.81.

Book

European Hybrid Microelectronics Conference. 0003: proceedings : Avignon, 20.05.81-22.05.81.

1981

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18

Internationales wissenschaftliches Kolloquium / Technische Hochschule Ilmenau. 32,4. Vortragsreihe B1 / B2 : Ilmenau, 26.10.87-30.10.87.

Book

Internationales wissenschaftliches Kolloquium / Technische Hochschule Ilmenau. 32,4. Vortragsreihe B1 / B2 : Ilmenau, 26.10.87-30.10.87.

1987

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19

Conference on solid state devices and materials 0019: extended abstracts : SSDM 0019: extended abstracts : Tokyo, 25.08.87-27.08.87.

Book

Conference on solid state devices and materials 0019: extended abstracts : SSDM 0019: extended abstracts : Tokyo, 25.08.87-27.08.87.

1987

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20

Spring meeting / Electrochemical Society: 1986 : Society meeting 0169 : Boston, MA, 04.05.86-09.05.86.

Book

Spring meeting / Electrochemical Society: 1986 : Society meeting 0169 : Boston, MA, 04.05.86-09.05.86.

1986

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Print Edition 91 Electronic Edition 4

Conference Publication

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ZB IBN-1-2 1 IBN-3-4 1 IEK-5 1 IFF 1 PTJ 1

Biswas, Rajendra Narayanan 2 Constantopoulos, N. 2 Hartnagel, Hans Ludwig 2 Hölzle, R. 2 Kaiser, G. 2 Levy, R. A. 2 more ... Sugano, T. 2 Adler, David A. 1 Akins, Vaughn 1 Anthony, Joseph B. 1 Bean, K. E. 1 Beguwala, M. M. 1 Board, K. 1 Brillson, L. J. 1 Broydo, S. 1 Bryant, R. 1 Buckley, D. N. 1 Burnett, David 1 Burnham, M. 1 Chalamala, Babu R. 1 Chiang, A. 1 Colinge, Jean-Pierre 1 Craighead, H. G. 1 Davis, G. E. 1 Delloca, C. J. 1 Doehl-Oelze, R. 1 Fujisawa, Toshio. 1 Higashi, Gregg S. 1 Howard, R. E. 1 Ipri, A. 1 see all ... less ...

microelectronics 20 semiconductor device 15 integrated circuit 13 VLSI technology 9 electronic device 9 microfabrication (for microelectronics only) 8 more ... semiconductor processing 6 VLSI (very large scale integration) 5 sensor (technical and physical) 5 thin film technology 5 solid state device 4 MOS device 3 cleaning 3 dielectric constant 3 information technology 3 quantum electronics 3 dielectric material 2 display device 2 epitaxy 2 microtechnology 2 nanotechnology 2 passivation 2 semiconductor 2 semiconductor interface 2 semiconductor surface 2 shape memory effect 2 superconducting electronics 2 wafer scale integration 2 III - V semiconductor 1 antenna 1 see all ... less ...

FGM - Microelectronic technology TBF - Semiconductor devices 14 TBV - Electronic devices 11 FGK - Thin film technology, epitaxy 10 FJL - Physics of solid state devices 10 FAF - Materials research - comprehensive works 8 more ... FFPE - Thin film electronic properties, semiconductor interfaces 5 FJLB - Physics of semiconductor devices 5 FAQ - Materials research - institutions, research and development 4 TBJ - Integrated circuits 4 TBL - VLSI 4 FGMH - Metallization, physics of microelectronics 3 FJH - Semiconductor physics 3 FFP - Physics of thin films 2 FGN - Nanotechnology 2 FGT - Microtechnology 2 FJBC - Dielectric materials 2 FJKC - III - V semiconductors 2 FPU - Corrosion protection, surface coating 2 TBA - Electronic engineering - general 2 TBW - Sensors, actuators 2 CNJ - Electrochemistry - comprehensive works 1 CNWK - Electric batteries 1 ETF - Fuel cells - general 1 FFGH - Electron emission, field emission 1 FGG - Ion beam technology 1 FGKJ - Plasma processing, etching 1 FGML - Characterization of electronic materials 1 FHAB - Surface and thin film characterization 1 FJEC - Amorphous semiconductors 1 see all ... less ...

English 7 German 2

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