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FGML - Characterization of electronic materials
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FGML - Characterization of electronic materials
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1
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Point and extended defects in semiconductors : NATO advanced research workshop/international school of materials science and technology workshop on point, extended and surface defe...
Benedek, G.
1990
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...NATO ASI
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. B.
Physics
;...
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2
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Spectroscopy of semiconductor microstructures : NATO advanced research workshop on spectroscopy of semiconductor microstructures: proceedings : Venezia, 09.05.89-13.05.89 /
Fasol, G.
1989
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...NATO ASI
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. B,
Physics
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3
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Evaluation of advanced semiconductor materials by electron microscopy : NATO advanced research workshop on the evaluation of advanced semiconductor materials by electron microscopy...
Cherns, D.
1989
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Physics
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Nondestructive evaluation of semiconductor materials and devices : NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices : Frascati, 19....
Zemel, J. N.
1979
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...NATO advanced study institutes
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. B.
Physics
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Available as
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4
Material Type
Book
4
Type of Literature
Conference Publication
4
Year of Publication
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Location
ZB
4
Name
Benedek, G.
1
Cherns, D.
1
Fasol, G.
1
Zemel, J. N.
1
Subject
semiconductor
2
defect analysis
1
dislocation
1
electron microscopy
1
grain boundary
1
materials characterization
1
more ...
point defect
1
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Classification
FGML - Characterization of electronic materials
FHG - Electron microscopy
1
FJHE - Defects and radiation effects in semiconductors
1
FJNC - Optical spectroscopy in solids
1
Language
English
4
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