Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
FHAB - Surface and thin film characterization
AND
FHEG - Tunneling microscopy, force microscopy
ZB
Electronic Edition
Theses
Reset Filters
Show filters (5)
FHAB - Surface and thin film characterization
AND
FHEG - Tunneling microscopy, force microscopy
ZB
Electronic Edition
Theses
Ask a Librarian
Books & more
: Hits
1 - 8
of
8
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
E-Book
Creating and characterizing a single molecule device for quantitative surface science [E-Book] /
Green, Matthew Felix Blishen
2018
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 2
2
E-Book
Morphologie und Energetik kleiner Bleikristalle untersucht mit Rastertunnel- und Rasterelektronenmikroskopie [E-Book] /
Emundts, Arndt
2001
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 3
3
E-Book
Entwicklung eines Rastertunnelmikroskops in Kombination mit einer Anlage zur Molekularstrahlepitaxie und Photoemissionsspektroskopie [E-Book]/
Daniels, Claudia
2000
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 4
4
E-Book
Untersuchung dynamsicher Prozesse bei der Molekularstrahlepitaxie auf Silizium [E-Book] /
Kästner, Martin
1998
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 5
5
E-Book
Aufbau eines hochauflösenden Elektronenenergieverlustspektrometers mit integriertem Rastertunnelmikroskop : potentielle Einsatzmöglichkeiten erläutert am Beispiel der Ostwald-Reifu...
Klünker, Christian
1998
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 6
6
E-Book
Mechanismen der Desorption und Entmischung auf Indiumphosphid (110)-Oberflächen bei thermischer Behandlung [E-Book] /
Heinrich, Marcus
1997
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 7
7
E-Book
Morphologische Entwicklung von Pt (111) bei Pt-Deposition und Ionenstrahlerosion [E-Book] /
Kalff, Matthias
1999
Full text
JuSER
Favorites
Saved in:
QR Code
Select result number 8
8
E-Book
Rastertunnelmikroskopische und -spektroskopische Untersuchungen an strukturierten Ge/Si(111)-Oberflächen [E-Book] /
Theuerkauf, Nils
1999
Full text
JuSER
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
/* Narrow Search Options */ ?>
Back
Narrow Search Results
Available as
Electronic Edition
Material Type
Book
8
Type of Literature
Theses
Year of Publication
From:
To:
Location
ZB
Name
Daniels, Claudia
1
Emundts, Arndt
1
Green, Matthew Felix Blishen
1
Heinrich, Marcus
1
Kalff, Matthias
1
Klünker, Christian
1
more ...
Kästner, Martin
1
Theuerkauf, Nils
1
see all ...
less ...
Subject
scanning tunneling microscopy
8
surface analysis
3
molecular beam epitaxy
2
III - V semiconductor
1
adsorption
1
charge
1
more ...
desorption
1
diffusion
1
electron energy loss spectroscopy
1
force microscopy
1
heteroepitaxy
1
indium phosphide
1
microscopy
1
modeling
1
monomolecular film
1
nucleation
1
photoelectron spectroscopy
1
platinum
1
quantum dot
1
scanning electron microscopy
1
silicon
1
surface
1
surface dynamics
1
surface energy
1
surface reaction
1
surface structure
1
temperature dependence
1
vacuum deposition
1
see all ...
less ...
Classification
FHAB - Surface and thin film characterization
FHEG - Tunneling microscopy, force microscopy
FGKC - Vacuum deposition, MBE
2
CLJE - Catalyst characterization and surface phenomena
1
CLP - Colloid chemistry, surface chemistry
1
FCD - Crystal physics
1
more ...
FFA - Surface science, surface physics - general aspects
1
FFGC - Electron spectroscopy
1
FFJ - Surface structure, gas solid interface
1
FFJB - Surface dynamics
1
FFJE - Molecular surface processes, gas surface interaction, adsorption
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
FJKC - III - V semiconductors
1
see all ...
less ...
Language
German
7
English
1
/* End Narrow Search Options */ ?>
×
Loading...