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FHCF - Defect characterization
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FJKC - III - V semiconductors
ZB
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FHCF - Defect characterization
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FJKC - III - V semiconductors
ZB
Theses
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1
E-Book
Elektronenmikroskopische Untersuchungen von Gitterbaufehlern in Galliumarsenid [E-Book] /
Schloßmacher, Peter
1991
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2
E-Book
Untersuchung struktureller Defekte in GaAs mit Röntgen-Kleinwinkelstreuung unter Anwendung der Streukontrastvariation [E-Book] /
Gebhardt, Roman
1993
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2
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ZB
Name
Gebhardt, Roman
1
Schloßmacher, Peter
1
Subject
defect analysis
2
gallium arsenide
2
crystal defect
1
defect structure
1
small angle X-ray scattering
1
Classification
FHCF - Defect characterization
FJHE - Defects and radiation effects in semiconductors
2
FJKC - III - V semiconductors
FHCB - X-ray scattering
1
FHCD - Small angle scattering
1
Language
German
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