Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
FHEE - X-ray microscopy, surface topography
nanostructured material
Reset Filters
Show filters (2)
FHEE - X-ray microscopy, surface topography
nanostructured material
Ask a Librarian
Books & more
: Hits
1 - 1
of
1
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
Nanocharacterisation /
Kirkland, August I.
2007
“
...
FGN
-
Nanotechnologie
...
”
Call number:
Loading...
Located:
Loading...
Table of Contents
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Print Edition
1
Material Type
Book
1
Year of Publication
From:
To:
Location
IFF
1
ZB
1
Name
Kirkland, August I.
1
Subject
X-ray analysis
1
electron microscopy
1
holography
1
materials characterization
1
nanostructured material
nanostructures
1
more ...
nanotechnology
1
scanning electron microscopy
1
scanning transmission electron microscopy
1
tomography
1
see all ...
less ...
Classification
FFGC - Electron spectroscopy
1
FGN - Nanotechnology
1
FHA - Materials characterization - general aspects
1
FHEE - X-ray microscopy, surface topography
FNPE - Nanostructured materials
1
×
Loading...
