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FHEG - Tunneling microscopy, force microscopy
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FJKC - III - V semiconductors
Electronic Edition
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FHEG - Tunneling microscopy, force microscopy
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FJKC - III - V semiconductors
Electronic Edition
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1
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Mechanismen der Desorption und Entmischung auf Indiumphosphid (110)-Oberflächen bei thermischer Behandlung [E-Book] /
Heinrich, Marcus
1997
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Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
Ebert, Philipp
1993
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Untersuchungen von Grenzflächen und Gitterbaufehlern in Galliumarsenid mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Cox, Gerhard
1990
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Available as
Electronic Edition
Material Type
Book
3
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Theses
3
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Location
ZB
3
Name
Cox, Gerhard
1
Ebert, Philipp
1
Heinrich, Marcus
1
Subject
scanning tunneling microscopy
3
III - V semiconductor
1
desorption
1
dislocation
1
gallium arsenide
1
indium phosphide
1
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surface analysis
1
surface defect
1
temperature dependence
1
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Classification
FHEG - Tunneling microscopy, force microscopy
FJKC - III - V semiconductors
FJHE - Defects and radiation effects in semiconductors
2
FFJ - Surface structure, gas solid interface
1
FHAB - Surface and thin film characterization
1
Language
German
3
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