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FHEG - Tunneling microscopy, force microscopy
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FJKC - III - V semiconductors
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FHEG - Tunneling microscopy, force microscopy
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FJKC - III - V semiconductors
Theses
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1
Book
Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /
Schwartzkopff, Michael.
1999
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2
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Untersuchungen von Grenzflächen und Gitterbaufehlern in Galliumarsenid mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Cox, Gerhard
1990
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3
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Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
Ebert, Philipp
1993
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4
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Mechanismen der Desorption und Entmischung auf Indiumphosphid (110)-Oberflächen bei thermischer Behandlung [E-Book] /
Heinrich, Marcus
1997
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Available as
Electronic Edition
3
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1
Material Type
Book
4
Type of Literature
Theses
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ZB
4
Name
Cox, Gerhard
1
Ebert, Philipp
1
Heinrich, Marcus
1
Schwartzkopff, Michael.
1
Subject
scanning tunneling microscopy
4
III - V semiconductor
2
desorption
1
dislocation
1
gallium arsenide
1
indium phosphide
1
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luminescence
1
semiconductor surface
1
surface analysis
1
surface defect
1
temperature dependence
1
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Classification
FHEG - Tunneling microscopy, force microscopy
FJKC - III - V semiconductors
FHAB - Surface and thin film characterization
2
FJHE - Defects and radiation effects in semiconductors
2
FFJ - Surface structure, gas solid interface
1
Language
German
3
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