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FHEG - Tunneling microscopy, force microscopy
AND
FNX - Carbon, carbon materials
Electronic Edition
Theses
electronic structure
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FHEG - Tunneling microscopy, force microscopy
AND
FNX - Carbon, carbon materials
Electronic Edition
Theses
electronic structure
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Untersuchung des Einflusses unterschiedlicher Dotierungen auf die elektronische Struktur von deponierten Einzelfullerenen mittels Rastertunnelspektroskopie [E-Book] /
Wirth, Ingo
2002
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Wirth, Ingo
1
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electronic structure
fullerenes
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scanning tunneling microscopy
1
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FHEG - Tunneling microscopy, force microscopy
FNX - Carbon, carbon materials
Language
German
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