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FHEG - Tunneling microscopy, force microscopy

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FHEG - Tunneling microscopy, force microscopy

Theses

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Electromechanical force microscopy and tip-enhanced raman spectroscopy for polar oxide nanoparticles /

Röhrig, Serge
2009

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Untersuchungen zum Stossionisationsdurchbruch in p-Germanium mit einem Tieftemperatur-Rastertunnelmikroskop /

Muz, Christof.
1998

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Untersuchungen über Wachstum, Haftung, Härte und Elastizität dünner Goldschichten auf unterschiedlichen Substraten mit Rasterkraftmikroskop /

Kracke, Berthold.
1996

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Scanning tunneling microscope study of carbon nanotubes /

Zha, Fangxing.
2001

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Surface structure of proteins and their conformational changes observed by atomic force microscopy /

Müller, Daniel J.
1997

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Untersuchungen zum Verhalten nanokristalliner Metallpartikel auf Si mit dem Rastertunnelmikroskop /

Radojkovic, Peter.
1999

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Aufbau und Anwendungen eines Tieftemperaturrastertunnelmikroskops mit Spektroskopieeinheit /

Aldinger, Rolf
2000

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Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /

Schwartzkopff, Michael.
1999

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Rastertunnelmikroskopie an Supraleitern und Fulleren bei tiefen Temperaturen [Microfiche] /

Behler, Stefan.
1994

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Ladungstransportmessungen an Si(111) Oberflächen mit einem Multispitzen-Rastertunnelmikroskop /

Blab, Marcus
2014

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Ladungstransportmessungen an Si(111) Oberflächen mit einem Multispitzen-Rastertunnelmikroskop [E-Book] /

Blab, Marcus
2014

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Ladungstransport durch Graphenschichten und GaAs-Nanodrähte untersucht mit einem Multispitzen-Rastertunnelmikroskop /

Korte, Stefan
2014

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Ladungstransport durch graphenschichten und GaAs-Nanodrähte untersucht mit einem Multispitzen-Rastertunnelmikroskop [E-Book] /

Korte, Stefan
2014

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Submolecular imaging with single particle atomic force sensors [E-Book] /

Kichin, Georgy
2014

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Submolecular imaging with single particle atomic force sensors /

Kichin, Georgy
2014

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Strukturuntersuchungen von adsorbatinduzierten Rekonstruktionen der Ni(110)- und Cu3Au(110)-Oberfläche mit niederenergetischer Ionenstreuung und Rastertunnelmikroskopie [E-Book] /

Voetz, Matthias
1995

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Creating and characterizing a single molecule device for quantitative surface science /

Green, Matthew Felix Blishen
2018

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Scanning tunneling potentiometry at nanoscale defects in thin films /

Lüpke, Felix
2018

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Creating and characterizing a single molecule device for quantitative surface science [E-Book] /

Green, Matthew Felix Blishen
2018

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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /

Lüpke, Felix
2018

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Electronic Edition 53 Print Edition 21

Book 74

Theses

From:

To:

Blab, Marcus 2 Green, Matthew Felix Blishen 2 Kichin, Georgy 2 Korte, Stefan 2 Lüpke, Felix 2 Reichenberg, Bernd 2 more ... Röhrig, Serge 2 Schnedler, Michael 2 Weiss, Christian 2 Wirth, Ingo 2 Aldinger, Rolf 1 Anders, Michael 1 Bach, Claudia 1 Baier, Axel Sascha 1 Bayerbach, Markus. 1 Behler, Stefan. 1 Berthe, Rolf 1 Birkner, Alexander 1 Bott, Michael 1 Breuer, Norbert 1 Cox, Gerhard 1 Daniels, Claudia 1 Domke, Christiane 1 Ebert, Philipp 1 Emundts, Arndt 1 Flores-Pyttel, Thomas 1 Frohn, Josef 1 Göddenhenrich, Thomas 1 Hannemann, Heike 1 Heinrich, Marcus 1 see all ... less ...

scanning tunneling microscopy 63 force microscopy 14 surface analysis 7 surface dynamics 5 charge transport 4 platinum 4 more ... surface 4 surface structure 4 thin film 4 titanate 4 III - V semiconductor 3 defect analysis 3 fullerenes 3 gold 3 low temperature 3 morphology 3 scanning electron microscopy 3 scanning probe microscopy 3 silicon 3 Raman spectroscopy 2 adsorption 2 barium 2 carbon 2 charge 2 copper 2 defect 2 diffusion 2 electric conductivity 2 gallium arsenide 2 graphene 2 see all ... less ...

FHEG - Tunneling microscopy, force microscopy FHAB - Surface and thin film characterization 12 FFJ - Surface structure, gas solid interface 7 FNX - Carbon, carbon materials 7 FHA - Materials characterization - general aspects 6 FHE - Imaging methods in materials characterization 6 more ... FFJB - Surface dynamics 5 FJKC - III - V semiconductors 4 FFJE - Molecular surface processes, gas surface interaction, adsorption 3 FHJ - Scanning electron microscopy, analytical electron microscopy 3 FJHE - Defects and radiation effects in semiconductors 3 CLJE - Catalyst characterization and surface phenomena 2 CLP - Colloid chemistry, surface chemistry 2 CUSE - Raman spectroscopy 2 FFA - Surface science, surface physics - general aspects 2 FGKC - Vacuum deposition, MBE 2 FJH - Semiconductor physics 2 FJKB - Elemental semiconductors 2 FLE - Superconductor materials 2 CNOP - Transport phenomena in electrolytes 1 CNRO - Electrode processes 1 FCD - Crystal physics 1 FDCH - Defects in metals 1 FEJH - Low dimensional materials, intercalation compounds 1 FFGC - Electron spectroscopy 1 FFGH - Electron emission, field emission 1 FFM - Liquid interfaces, adhesion 1 FGCB - Nucleation, crystallization phenomena 1 FGGJ - Ion beam analysis, ion beam solid interaction 1 FGK - Thin film technology, epitaxy 1 see all ... less ...

German 49 English 14

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