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FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
III - V semiconductor
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FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
III - V semiconductor
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1
E-Book
Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
Ebert, Philipp
1993
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Entwicklung eines Rastertunnelmikroskops in Kombination mit einer Anlage zur Molekularstrahlepitaxie und Photoemissionsspektroskopie [E-Book]/
Daniels, Claudia
2000
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Electronic Edition
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Book
2
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Theses
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ZB
2
Name
Daniels, Claudia
1
Ebert, Philipp
1
Subject
III - V semiconductor
scanning tunneling microscopy
2
molecular beam epitaxy
1
photoelectron spectroscopy
1
surface analysis
1
surface defect
1
Classification
FHEG - Tunneling microscopy, force microscopy
FFJ - Surface structure, gas solid interface
1
FHAB - Surface and thin film characterization
1
FJHE - Defects and radiation effects in semiconductors
1
FJKC - III - V semiconductors
1
Language
German
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