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FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
fullerenes
AND
scanning tunneling microscopy
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FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
fullerenes
AND
scanning tunneling microscopy
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1
E-Book
Untersuchung des Einflusses unterschiedlicher Dotierungen auf die elektronische Struktur von deponierten Einzelfullerenen mittels Rastertunnelspektroskopie [E-Book] /
Wirth, Ingo
2002
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2
E-Book
Rastertunnelmikroskopie und -spektroskopie an deponierten Einzelfullerenen : C60, Ce@C60 und La@C60 [E-Book] /
Kann, Gunther H.
2000
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ZB
2
Name
Kann, Gunther H.
1
Wirth, Ingo
1
Subject
fullerenes
scanning tunneling microscopy
electronic properties
1
electronic structure
1
Classification
FHEG - Tunneling microscopy, force microscopy
FNX - Carbon, carbon materials
2
Language
German
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