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FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
gallium arsenide
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FHEG - Tunneling microscopy, force microscopy
Electronic Edition
Theses
gallium arsenide
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Untersuchungen von Grenzflächen und Gitterbaufehlern in Galliumarsenid mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Cox, Gerhard
1990
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Untersuchung der Kristallgitterdefekte und der Kompensationsmechanismen in hoch siliziumdotiertem GaAs mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Domke, Christiane
1998
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Electronic Edition
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Book
2
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ZB
2
Name
Cox, Gerhard
1
Domke, Christiane
1
Subject
gallium arsenide
scanning tunneling microscopy
2
defect
1
dislocation
1
silicon
1
Classification
FHEG - Tunneling microscopy, force microscopy
FJHE - Defects and radiation effects in semiconductors
2
FJKC - III - V semiconductors
1
Language
German
2
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