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FHEG - Tunneling microscopy, force microscopy
Theses
defect analysis
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FHEG - Tunneling microscopy, force microscopy
Theses
defect analysis
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Scanning tunneling potentiometry at nanoscale defects in thin films /
Lüpke, Felix
2018
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Scanning tunneling potentiometry at nanoscale defects in thin films [E-Book] /
Lüpke, Felix
2018
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Untersuchung von Defekten auf einer gestuften Silber(111)-Fläche mit einem Tieftemperatur- Rastertunnelmikroskop und hochauflösender Elektronenbeugung [E-Book] /
Wolf, J. Franciscus
1990
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Book
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ZB
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Name
Lüpke, Felix
2
Wolf, J. Franciscus
1
Subject
defect analysis
scanning tunneling microscopy
3
insulator
2
thin film
2
electron diffraction
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silver
1
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FHEG - Tunneling microscopy, force microscopy
FDCH - Defects in metals
1
FFJ - Surface structure, gas solid interface
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FHGE - Electron diffraction
1
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English
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German
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