ZB 83 IEK-5 16 IBN-1-2 10 IBN-3-4 7 IFF 1 JCNS-4 1

Seeger, K. 5 Scheffler, Matthias 4 Anastassakis, E. M. 3 Gibson, Alan F. 3 Joannopoulos, John D. 3 Landwehr, G. 3 more ... Rössler, Ulrich 3 Balkanski, M. 2 Boeer, K. W. 2 Cardona, Manuel. 2 Constantopoulos, Nicos 2 Drabold, David A. 2 Grundmann , Marius 2 Grundmann, Marius 2 Hilsum, C. 2 Irene, Eugene A. 2 Kaiser, G. 2 Koch, S. W. 2 Mahajan, S. 2 Pizzini, Sergio 2 Seeger, Karlheinz. 2 Suski, Tadeusz 2 Yu, Peter Y. 2 Zawadzki, W. 2 Banyai, L. 1 Bar-Lev, Adir. 1 Betz, Markus. 1 Bhattacharya, Pallab 1 Biswas, Dhrubes 1 Bonch-Bruevich, V. L. 1 see all ... less ...

semiconductor physics 91 semiconductor device 19 semiconductor 12 optical properties 8 high magnetic field effect 6 solid state physics 6 more ... defect 5 electronic structure 5 nanostructures 4 semiconductor interface 4 semiconductor surface 4 electronic properties 3 electronic transport 3 high temperature superconductor 3 physical properties 3 physics 3 semiconductor heterostructure 3 solid state device 3 III - V semiconductor 2 Monte Carlo method 2 Semiconductors. 2 amorphous semiconductor 2 band structure 2 electron phonon interaction 2 gallium arsenide 2 high pressure 2 impurity 2 integrated circuit 2 lattice defect 2 magnetic semiconductor 2 see all ... less ...

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