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FJHE - Defects and radiation effects in semiconductors
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FJKC - III - V semiconductors
ZB
Theses
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FJHE - Defects and radiation effects in semiconductors
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FJKC - III - V semiconductors
ZB
Theses
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1
E-Book
Elektronenmikroskopische Untersuchungen von Gitterbaufehlern in Galliumarsenid [E-Book] /
Schloßmacher, Peter
1991
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2
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Untersuchung struktureller Defekte in GaAs mit Röntgen-Kleinwinkelstreuung unter Anwendung der Streukontrastvariation [E-Book] /
Gebhardt, Roman
1993
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3
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Elektronenmikroskopische Charakterisierung von Versetzungen in plastisch verformtem InP [E-Book] /
Luysberg, Martina
1993
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4
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Untersuchung der bei der Eindiffusion von Zn in InP entstehenden Gitterfehlordnung.
Wittorf, Dirk.
1994
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5
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Structure, electronic properties, and interactions of defects in epitaxial GaN layers [E-Book] /
Weidlich, Phillip H.
2014
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6
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Structure, electronic properties, and interactions of defects in epitaxial GaN layers /
Weidlich, Phillip H.
2014
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Untersuchungen von Grenzflächen und Gitterbaufehlern in Galliumarsenid mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Cox, Gerhard
1990
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8
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Optische Spektroskopie und Röntgenbeugung an Fehlstellen in Galliumarsenid nach Tieftemperatur-Elektronenbestrahlung [E-Book] /
Pillukat, Alexander
1991
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9
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Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
Ebert, Philipp
1993
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Available as
Electronic Edition
7
Print Edition
2
Material Type
Book
9
Type of Literature
Theses
Year of Publication
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To:
Location
ZB
Name
Weidlich, Phillip H.
2
Cox, Gerhard
1
Ebert, Philipp
1
Gebhardt, Roman
1
Luysberg, Martina
1
Pillukat, Alexander
1
more ...
Schloßmacher, Peter
1
Wittorf, Dirk.
1
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Subject
gallium arsenide
4
III - V semiconductor
3
crystal defect
2
defect analysis
2
dislocation
2
gallium
2
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nitride
2
scanning tunneling microscopy
2
semiconductor
2
X-ray diffraction
1
crystal optics
1
defect structure
1
electron irradiation
1
impurity diffusion
1
plastic deformation
1
small angle X-ray scattering
1
surface defect
1
transmission electron microscopy
1
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Classification
FJHE - Defects and radiation effects in semiconductors
FJKC - III - V semiconductors
FHCF - Defect characterization
2
FHEG - Tunneling microscopy, force microscopy
2
FDCD - Dislocations
1
FFJ - Surface structure, gas solid interface
1
more ...
FHCB - X-ray scattering
1
FHCD - Small angle scattering
1
FHGB - Conventional electron microscopy
1
FJP - Optical materials, crystal optics
1
FPGB - Plastic deformation
1
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Language
German
6
English
2
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