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FJKC - III - V semiconductors
ZB
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Theses
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FJKC - III - V semiconductors
ZB
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Theses
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1
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Structure, electronic properties, and interactions of defects in epitaxial GaN layers /
Weidlich, Phillip H.
2014
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2
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Reaction and transport processes in OMCVD : selective and group III-nitride growth /
Mihopoulos, Theodoros.
1999
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3
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Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /
Schwartzkopff, Michael.
1999
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4
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Bivalente Störstellen in Silizium, Germanium und Galliumarsenid.
Roos, G.
1990
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5
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Zwei- dimensionale elektronische Systeme in Galliumarsenid/Al(x)Ga(1-x)Arsenid- Heterostrukturen unter dem Einfluss ionisierter Störstellen.
Richter, J.
1990
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6
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Pseudomorphe Indium Gallium Arsenid/Gallium(Aluminium)Arsenid Heterostrukturen: Wachstum und Charakterisierung.
Reithmaier, J. P.
1990
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7
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TEM/TED studies of epitaxial layers of ternary and quaternary group III-V compound semiconductor alloys.
Norman, A. G.
1987
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8
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Laterale Elektronen Supergitter auf Galliumarsenid.
Lorke, A. H.
1991
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9
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Untersuchung der bei der Eindiffusion von Zn in InP entstehenden Gitterfehlordnung.
Wittorf, Dirk.
1994
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10
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Zero field spin splitting in InGaAs/InAlAs heterostructures.
Das, Biswajit.
1989
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Print Edition
Material Type
Book
10
Type of Literature
Theses
Year of Publication
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Location
ZB
Name
Das, Biswajit.
1
Lorke, A. H.
1
Mihopoulos, Theodoros.
1
Norman, A. G.
1
Reithmaier, J. P.
1
Richter, J.
1
more ...
Roos, G.
1
Schwartzkopff, Michael.
1
Weidlich, Phillip H.
1
Wittorf, Dirk.
1
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Subject
III - V semiconductor
5
gallium arsenide
4
semiconductor heterostructure
2
chemical vapor deposition
1
electron diffraction
1
electronic transport
1
more ...
gallium
1
germanium
1
heterostructure
1
impurity
1
impurity diffusion
1
luminescence
1
modeling
1
nitride
1
scanning tunneling microscopy
1
semiconducting film
1
semiconductor
1
semiconductor surface
1
silicon
1
superlattice material
1
thin film
1
transmission electron microscopy
1
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Classification
FJKC - III - V semiconductors
FFPG - Multilayer systems, quantum structures
3
FFPE - Thin film electronic properties, semiconductor interfaces
2
FJHE - Defects and radiation effects in semiconductors
2
FGK - Thin film technology, epitaxy
1
FGKF - Chemical vapor deposition
1
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FHAB - Surface and thin film characterization
1
FHEG - Tunneling microscopy, force microscopy
1
FHGB - Conventional electron microscopy
1
FHGE - Electron diffraction
1
FJKB - Elemental semiconductors
1
FJNE - Active centers in solids
1
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Language
English
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