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FJKC - III - V semiconductors
ZB
Theses
dislocation
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FJKC - III - V semiconductors
ZB
Theses
dislocation
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1
E-Book
Elektronenmikroskopische Charakterisierung von Versetzungen in plastisch verformtem InP [E-Book] /
Luysberg, Martina
1993
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Untersuchungen von Grenzflächen und Gitterbaufehlern in Galliumarsenid mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Cox, Gerhard
1990
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Electronic Edition
2
Material Type
Book
2
Type of Literature
Theses
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ZB
Name
Cox, Gerhard
1
Luysberg, Martina
1
Subject
dislocation
III - V semiconductor
1
gallium arsenide
1
plastic deformation
1
scanning tunneling microscopy
1
transmission electron microscopy
1
Classification
FJHE - Defects and radiation effects in semiconductors
2
FJKC - III - V semiconductors
FDCD - Dislocations
1
FHEG - Tunneling microscopy, force microscopy
1
FHGB - Conventional electron microscopy
1
FPGB - Plastic deformation
1
Language
German
2
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