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Select result number 21
21
Book
Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.
Benninghoven, A.
1988
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22
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Theoretical methods of texture analysis /
Bunge, H.-J.
1987
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23
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Semiconductor interfaces : formation and properties : International winter school on semiconductor interfaces : formation and properties: workshop, proceedings : Les-Houches, 24.02...
Lelay, G.
1987
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24
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Geodäsie im Dienste der Gesellschaft : Deutscher Geodätentag. 0070 : Nürnberg, 03.09.86-06.09.86.
1986
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25
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Experimental techniques of texture analysis : Proceedings of a workshop : Clausthal-Zellerfeld, 25.03.85-29.03.85.
Bunge, H. J.
1986
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26
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Molecular beam epitaxy and heterostructures : Nato Advanced Study Institute on Molecular Beam Epitaxy (mbe) and Heterostructures: proceedings : Erice, 07.03.1983-19.03.1983.
Chang, L. L.
1985
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27
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Geodätische Netze in Landesvermessung und Ingenieurvermessung Vol 0002 : Kontaktstudium 1985: Vorträge : Hannover, 02.85.
Pelzer, H.
1985
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28
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Proton linear accelerator conference. 1968: proceedings. vol 0002 : Upton, NY, 20.05.1968-24.05.1968.
Bittner, J. W.
1968
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29
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Proton linear accelerator conference. 1968: proceedings. vol 0001 : Upton, NY, 20.05.1968-24.05.1968.
Bittner, J. W.
1968
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Available as
Print Edition
29
Material Type
Book
29
Type of Literature
Conference Publication
Year of Publication
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IBN-1-2
ZB
10
IEK-14
1
IEK-5
1
IFF
1
Name
Bittner, J. W.
2
Boccara, A. C.
2
Lendvay, E.
2
Ayon, Arturo A.
1
Aziz, Michael J.
1
Benninghoven, A.
1
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Bland, J. Anthony C.
1
Buchheit, Thomas E.
1
Bunge, H. J.
1
Bunge, H.-J.
1
Chang, L. L.
1
Claeys, C. L.
1
Eberl, K.
1
En, William G.
1
Gossmann, Hans-Joachim L.
1
Huff, H. R.
1
Kahn, Harold
1
Lakowicz, Joseph R.
1
Lelay, G.
1
Merhari, Lhadi
1
Norton, David
1
Pelzer, H.
1
Polman, Albert
1
Rehn, Lynn E.
1
Richter, H.
1
Soukoulis, Costas M.
1
Spearing, S. Mark
1
Stritzker, Bernd
1
Weinstock, H.
1
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Subject
epitaxy
4
crystal growth
2
ellipsometry
2
linear accelerator
2
semiconductor interface
2
silicon
2
more ...
superconducting electronics
2
ULSI (ultra large scale integration)
1
biological aspect
1
biological membrane
1
biomagnetism
1
biomolecule
1
crystal optics
1
dielectric film
1
engineering
1
fluorescence
1
geodesy
1
gettering
1
heterostructure
1
high temperature superconductor
1
integrated circuit
1
ion source
1
laser spectroscopy
1
lithography
1
materials
1
materials science
1
mechanical properties
1
microelectronics
1
microstructure
1
multilayer system
1
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Classification
FGK - Thin film technology, epitaxy
5
FGM - Microelectronic technology
3
FAF - Materials research - comprehensive works
2
FFPG - Multilayer systems, quantum structures
2
FJHE - Defects and radiation effects in semiconductors
2
FJNC - Optical spectroscopy in solids
2
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FLGD - Superconducting devices, circuits
2
FMHJ - Texture
2
GSA - Applied geodesy
2
PKA - Elementary particles, nuclei - general
2
CUM - Laser spectroscopy
1
FFPE - Thin film electronic properties, semiconductor interfaces
1
FGGE - Ion beam surface modification
1
FGGJ - Ion beam analysis, ion beam solid interaction
1
FGJ - Laser and electron beam processing
1
FGKC - Vacuum deposition, MBE
1
FGMH - Metallization, physics of microelectronics
1
FGN - Nanotechnology
1
FJLB - Physics of semiconductor devices
1
FJP - Optical materials, crystal optics
1
FKC - Magnetism - specific aspects
1
FNPE - Nanostructured materials
1
HBA - Medical physics
1
LKH - Biochemistry - methods
1
LME - Biophysics - general aspects
1
PEGC - Propagation and transmission of optical waves
1
TBF - Semiconductor devices
1
TBJ - Integrated circuits
1
TBT - Optoelectronics, optical fibers, displays
1
TBV - Electronic devices
1
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Language
English
5
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