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IBN-3-4
Morita, Seizo
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IBN-3-4
Morita, Seizo
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1
Book
Noncontact atomic force microscopy 2 /
Morita, Seizo
2009
“
...
FHEG
-
Tunneling
microscopy
,
force
microscopy
...
”
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2
Book
Roadmap for scanning probe microscopy : 6 tables /
Morita, Seizo
2007
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...
FHEG
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Tunneling
microscopy
,
force
microscopy
...
”
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Select result number 3
3
Book
Noncontact atomic force microscopy /
Morita, Seizo
2002
“
...
FHEG
-
Tunneling
microscopy
,
force
microscopy
...
”
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IBN-3-4
ZB
1
Name
Morita, Seizo
Subject
force microscopy
2
imaging technique
2
scanning probe microscopy
2
semiconductor surface
2
surface analysis
2
force microscopy scanning
1
more ...
nanotechnology
1
scanning tunneling microscopy
1
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Classification
FHEG - Tunneling microscopy, force microscopy
3
FHAB - Surface and thin film characterization
2
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