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1
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Surface analysis - the principal techniques /
Vickerman, John C.
2013
Subject (ZB):
“
...
scanning
probe
microscopy
...
”
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IEK-4
ZB
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Name
Vickerman, John C.
1
Subject
Auger electron spectroscopy
1
SIMS (secondary ion mass spectroscopy)
1
electron spectroscopy
1
ion scattering
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scanning probe microscopy
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surface analysis
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surface vibrational spectroscopy
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CUP - Vibrational spectroscopy
1
FFGC - Electron spectroscopy
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FHJ - Scanning electron microscopy, analytical electron microscopy
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