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IEK-5
FHE - Imaging methods in materials characterization
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FHE - Imaging methods in materials characterization
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Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A. /
Biegelsen, D. K.
1993
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IEK-5
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Biegelsen, D. K.
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imaging technique
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interface
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materials characterization
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surface
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FAF - Materials research - comprehensive works
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FHE - Imaging methods in materials characterization
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