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Neutron, X-ray and light scattering: introduction to an investigative tool for colloidal and polymeric systems : European workshop on neutron X-ray and light scattering as an inves...

Lindner, P.
1991

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Protein crystal growth: proceedings of the international conference. 0001 : Stanford, CA, 14.08.1985-16.08.1985.

Feigelson, R. S.
1986

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Metalorganic vapor phase epitaxy. 1986 : Universal-City, CA, 13.04.1986-17.04.1986.

Stringfellow, Gerald B.
1986

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Ecoss. 0007 : European Conference on Surface Science : 0007: proceedings : Aix-en-Provence, 01.04.1985-04.04.1985.

Cabane, F.
1985

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Ecoss. 0005 : Solid vacuum interface symposium. 0007 : Gent, 24.08.82-27.08.82.

Vennik, J.
1983

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Applied surface analysis : Applied surface analysis: symposium. 0004 : Dayton, OH, 09.06.82-11.06.82.

Grant, J. T.
1983

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Progress in cathode research : Tri service cathode workshop 3 : Fort-Monmouth, NJ, 23.03.1983-26.03.1983.

Thomas, R. E.
1983

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Surfaces and interfaces: Physics and electronics : Ictp iupap semiconductor symposium : proceedings of the symposium. 000 : Trieste, 30.08.82-03.09.82.

Bauer, R. S.
1983

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Statistical mechanics of adsorption : Proceedings of a symposium : Trieste, 26.07.82-29.07.82.

Cole, M. W.
1983

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Ecoss. 0004 : Münster, 14.09.81-16.09.81.

Benninghoven, A.
1982

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Solid films and surfaces : Solid films and surfaces: international conference. 0002: proceedings : College-Park, MD, 08.06.81-11.06.81.

Gadzuk, J. W.
1982

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Electron and ion beam methods for surface analysis : international workshop : Newcastle, 23.02.81-27.02.81.

Grant, J. T.
1982

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Crystal growth 1980 : Crystal growth: international conference 0006 : Moskva, 10.09.80-16.09.80.

Givargizov, E. I.
1981

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Small particles and inorganic clusters : The small particles and inorganic clusters: international meeting 0002 : Lausanne, 08.09.80-12.09.80.

Borel, J. P.
1981

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Ipat 1981 : Ion and plasma assisted techniques: international conference 3 : Amsterdam, 30.06.81-02.07.81.

1981

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Applied surface analysis : symposium. 2 : Papers : Dayton, OH, 11.06.80-13.06.80.

Grant, J. T.
1981

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Applied surface analysis : symposium. 0003 : Dayton, OH, 03.06.81-05.06.81.

Grant, J. T.
1981

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Metalorganic vapor phase epitaxy : Metalorganic vapor phase epitaxy: international conference. 0001 : ICMOVPE 0001 : Ajaccio, 04.05.81-06.05.81.

Bonfils, J. F.
1981

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Growth and characterization of inp : Workshop : Harwichport, MA, 17.06.80-19.06.80.

Kennedy, J. K.
1981

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European crystal growth 1979 : Crystal growth : European conference 0002: invited review papers : Lancaster, 10.09.79-15.09.79.

Cockayne, B.
1980

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Print Edition 40

Book 40

Conference Publication

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IFF ZB 39 IBN-3-4 23 TB 1

Grant, J. T. 5 Kelly, R. 2 Balkanski, M. 1 Bashara, N. M. 1 Bauer, R. S. 1 Benninghoven, A. 1 more ... Bonfils, J. F. 1 Borel, J. P. 1 Cabane, F. 1 Cockayne, B. 1 Cole, M. W. 1 Cullen, G. W. 1 Dorda, G. 1 Eyring, LeRoy 1 Feigelson, R. S. 1 Furtak, T. E. 1 Gadzuk, J. W. 1 Givargizov, E. I. 1 Kawaji, S. 1 Kennedy, J. K. 1 Levenson, Leonard L. 1 Lindner, P. 1 Muller, R. H. 1 Parker, R. L. 1 Ponec, V. 1 Quinn, J. J. 1 Stringfellow, Gerald B. 1 Takahashi, K. 1 Thomas, R. E. 1 Ueda, R. 1 see all ... less ...

surface physics 7 surface analysis 5 surface electronic properties 5 surface reaction 5 crystal growth 3 surface structure 3 more ... ellipsometry 2 ion surface collision 2 semiconductor surface 2 thin film physics 2 vapor phase epitaxy 2 SIMS (secondary ion mass spectroscopy) 1 X-ray scattering 1 adsorption 1 atomic beam scattering 1 chemisorption 1 colloid 1 disperse system 1 electron spectroscopy 1 ion beam analysis 1 ion emission 1 light scattering 1 metal cluster 1 microparticle system 1 neutron scattering 1 polymer characterization 1 small angle scattering 1 sputtering 1 surface defect 1 surface electronic structure 1 see all ... less ...

FFA - Surface science, surface physics - general aspects 11 FHAB - Surface and thin film characterization 7 FGKF - Chemical vapor deposition 4 FFPG - Multilayer systems, quantum structures 3 FGC - Crystal growth, crystal technology 3 FFP - Physics of thin films 2 more ... FFPE - Thin film electronic properties, semiconductor interfaces 2 FGCD - Crystal growth of specific substances 2 FGGJ - Ion beam analysis, ion beam solid interaction 2 FJNC - Optical spectroscopy in solids 2 CBRH - Inorganic clusters 1 CLPD - Disperse systems 1 CUS - Light scattering 1 FDCJ - Defects in nonmetals 1 FEFE - Nonstoichiometric systems 1 FFGC - Electron spectroscopy 1 FFGH - Electron emission, field emission 1 FFJE - Molecular surface processes, gas surface interaction, adsorption 1 FFMC - Adsorption from solutions 1 FGGE - Ion beam surface modification 1 FGKJ - Plasma processing, etching 1 FHCB - X-ray scattering 1 FHN - Neutron scattering 1 FJKC - III - V semiconductors 1 FNCG - Specific molecular crystals 1 FNGE - Polymer characterization 1 LLE - Protein chemistry - general aspects 1 LMN - Molecular biophysics, biophysical chemistry 1 PCB - Statistical physics 1 see all ... less ...

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