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Nanoscale four-point charge transport measurements in topological insulator thin films /
Leis, Arthur
2021
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Untersuchung der Ladungsträgerkonzentration und -beweglichkeit in mikrokristallinen Siliziumlegierungen mit Hall-Effekt und Thermokraft /
Sellmer, Christian
2012
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Leis, Arthur
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Sellmer, Christian
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charge transport
thin film
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amorphous material
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insulator
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phase transition
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scanning tunneling microscopy
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silicon
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FJC - Electronic properties of solids
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