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1
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Spectroscopic ellipsometry : principles and applications /
Fujiwara, Hiroyuki.
2007
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FJN
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Optische
Festkörpereigenschaften
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2
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Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces /
Linke, Felix
2004
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FJN
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Optische
Festkörpereigenschaften
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Fujiwara, Hiroyuki.
1
Linke, Felix
1
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ellipsometry
microscopy
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FJNC - Optical spectroscopy in solids
2
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