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1
Book
Rare-earth borides /
Inosov, Dmytro S.
2022
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FCBH
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Crystal
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2
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Heterostructural interface modelling /
Fisher, David J.
2019
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3
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Fink, Thomas
2018
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Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem...
Michard, Stephan Yann
2015
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ZB
3
JCNS-4
1
Name
Fink, Thomas
1
Fisher, David J.
1
Inosov, Dmytro S.
1
Michard, Stephan Yann
1
Subject
thin film
crystal structure
2
silicon
2
Raman spectroscopy
1
boride
1
boundary layer
1
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chemical vapor deposition
1
composite materials
1
crystal growth
1
crystal structure analysis
1
deposition
1
epitaxy
1
graphite
1
graphite compound
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interface
1
internal stress
1
ionic conductivity
1
joint
1
lattice matching
1
lattice theory
1
materials characterization
1
materials science
1
microtechnology
1
modeling
1
neutron scattering
1
physical properties
1
raman spectroscopy
1
semiconductor
1
semiconductor interface
1
semiconductor physics
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Classification
FCBH - Crystal structure of specific substances
4
FCD - Crystal physics
3
FHAB - Surface and thin film characterization
2
CHLK - Intermolecular forces
1
CUSE - Raman spectroscopy
1
EISF - Thin film solar cells
1
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FCA - Crystallography
1
FCBE - Chemical bond in crystals
1
FFPE - Thin film electronic properties, semiconductor interfaces
1
FGCD - Crystal growth of specific substances
1
FJLB - Physics of semiconductor devices
1
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English
3
German
1
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