1
Group IV (Si)GeSn light emission and lasing studies /
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Investigation of GeSn as novel group IV semiconductor for electronic applications /
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Investigation of ternary nitride semiconductor alloys by scanning tunneling microscopy /
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Structure, electronic properties, and interactions of defects in epitaxial GaN layers /
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DC and RF characterization of NiSi Schottky barrier MOSFETs with dopant segregation /
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Fabrication and characterization of planar gunn diodes for monolithic microwave intergrated circuits /
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