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Comparison of thin film transistor and soi technologies : Symposium : Materials Research Society: spring meeting. 0001 : Albuquerque, NM, 26.02.1984-28.02.1984.
Lam, H. W.
1984
“
...
FFPE
-
Thin
film
electronic
properties
,
semiconductor
interfaces
...
”
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Lam, H. W.
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VLSI (very large scale integration)
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FAF - Materials research - comprehensive works
1
FFPE - Thin film electronic properties, semiconductor interfaces
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FGM - Microelectronic technology
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