1
Defect-interface interactions : symposium held November 29 - December 2, 1993, Boston, Massachusetts, USA : [Fall meeting MRS 1993]
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Silicides, germanides, and their interfaces: symposium : MRS fall meeting 1993 : Boston, MA, 29.11.93-02.12.93.
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3
Formation of semiconductor interfaces : International conference on the formation of semiconductor interfaces 0004: proceedings : ICFSI 0004: proceedings : Jülich, 14.06.93-18.06.93.
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4
Formation of semiconductor interfaces : 4th international conference ; abstracts of the papers presented at the ICFSI-4 held at the Forschungszentrum Jülich, Germany, from to 14 - 18 June 1993 /
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The physics and chemistry of SiO2 and the Silicon/SiO2 interface 0002 : Symposium on the physics and chemistry of the SiO2 and silicon/SiO2 interface 0002: proceedings : Meeting of the Electrochemical Society 0181 : Saint-Louis, MO, 18.05.92-21.05.92 ; 17.05.92-22.05.92.
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Ieee sos/soi technology conference 1990 : Key-West, FL, 02.10.1990-04.10.1990.
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7
Ieee sos/soi technology conference. 1989: proceedings : State-Line, NV, 03.10.89-05.10.89.
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Semiconductor interfaces : formation and properties : International winter school on semiconductor interfaces : formation and properties: workshop, proceedings : Les-Houches, 24.02.87-06.03.87.
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Lelay, G.
1987
“...FFPE - Thin film electronic properties, semiconductor interfaces...”
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Insulating films on semiconductors : Proceedings of the international conference : Infos. 85 : Toulouse, 16.04.1985-18.04.1985.
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Physical problems in microelectronics : International school on physical problems in microelectronics. 0004: proceedings : ISPPME. 1985 : Varna, 12.05.1985-18.05.1985.
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Physik der Halbleiteroberfläche. 16: Arbeitstagung: Tagungsbericht : Binz, 08.04.1985-13.04.1985.
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Physik der Halbleiteroberfläche Arbeitstagung. 15: Tagungsbericht : Binz, 02.04.1984-07.04.1984.
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Physik der Halbleiteroberfläche Arbeitstagung. 14: Tagungsbericht : Binz, 04.04.1983-09.04.1983.
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Insulating films on semiconductors : proceedings of the international conference, INFOS 83, Eindhoven, the Netherlands, 11-13 April, 1983 /
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Physik der Halbleiteroberfläche : Physik der Halbleiteroberfläche Arbeitstagung 12 : Binz, 30.03.1981-04.04.1981.
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1981
“...FFPE - Thin film electronic properties, semiconductor interfaces...”
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Insulating films on semiconductors. 1979 : Invited and contributed papers : Insulating films on semiconductors conference : European conference. 0001 : Infos 79 : Durham, 02.07.1979-04.07.1979.
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