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Fink, Thomas
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Fink, Thomas
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Fink, Thomas
2018
“
...
FHAB
-
Surface
and
thin
film
characterization
...
”
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie [E-Book] /
Fink, Thomas
2018
“
...
FHAB
-
Surface
and
thin
film
characterization
...
”
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Material Type
Book
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Theses
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ZB
2
Name
Fink, Thomas
Subject
crystal structure analysis
2
microtechnology
2
raman spectroscopy
2
silicon
2
thin film
2
Classification
CUSE - Raman spectroscopy
2
FCA - Crystallography
2
FCBH - Crystal structure of specific substances
2
FCD - Crystal physics
2
FHAB - Surface and thin film characterization
2
Language
German
2
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