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CUA - Spectroscopy
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Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium im Hinblick auf optische und optoelektronische Anwendungen [E-Book] /
Thönissen, Markus
1999
“
...
FHAB
-
Surface
and
thin
film
characterization
...
”
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Spectroscopy for surface science /
Clark, R. J. H.
1998
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FHAB
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Surface
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film
characterization
...
”
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IBI-6
1
ZB
1
Name
Clark, R. J. H.
1
Thönissen, Markus
1
Subject
spectroscopy
2
electrochemistry
1
optoelectronics
1
porous silicon
1
surface analysis
1
surface chemistry
1
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CUA - Spectroscopy
FHAB - Surface and thin film characterization
2
FEJP - Porous media, capillarity
1
FJKB - Elemental semiconductors
1
Language
German
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